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Follow on Google News | ![]() New Temperature Profile Tool to Help MOCVD Epi Wafer Producers Improve Device Performance and Yield“This tool is designed to quickly, easily, and accurately generate full carrier temperature maps on Veeco K465i and EPIK700 production MOCVD reactors. The kSA Scanning Pyro generates high-resolution, full carrier temperature maps to facilitate near real-time temperature adjustments and to identify hot/cold spots on carriers and wafers. MOCVD fabs with this tool can expect to have a competitive advantage in terms of yield, wafer uniformity and device performance,” The kSA scanning Pyro uses technology that combines simultaneous temperature measurements from two scanning sensor heads to map the entire carrier, from center thru the outer edge. Users can acquire either a full wafer carrier scan or a select sub-set of the full scan, and can then perform analysis with proprietary kSA software to identify problem areas. With this information in hand, engineers can make the necessary process and/or hardware adjustments to improve their product. This is the second new product that k-Space Associates has introduced in 2015. The first, kSA SpectraTemp for absolute temperature measurement, is used for absolute temperature calibration and measurement, or to calibrate the kSA Scanning Pyro tool. To learn more about either tool visit http://www.k- End
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