k-Space Introduces New Tool for Absolute Temperature Measurement

DEXTER, Mich. - Aug. 4, 2015 - PRLog -- k-Space Associates, Inc. (http://www.k-space.com/) (http://www.k-space.com/), leaders in thin film characterization products, announced today the worldwide release of its newest product, kSA SpectraTemp, a unique, self-calibratingabsolute source temperature measurement tool.

k-Space CEO, Darryl Barlett, commented, “Absolute temperature is a very difficult parameter to measure.  With kSA SpectraTemp, if the source radiation is blackbody-like, an absolute temperature is instantly determined.”

kSA SpectraTemp is a non-contact, optically-based technique for measuring the temperature of semiconductor wafers, metals, ceramics, and much more.  It is based on patented technology that analyzes the spectral radiation profile utilizing a solid-state spectrometer, resulting in fast data acquisition and real-time temperature measurement. The user simply reads the temperature from the screen.

MOCVD and other thin-film deposition facilities can use it to measure absolute temperature on wafer carriers, providing more accurate and reliable temperatures and tool-to-tool matching.  As production facilities adopt this technology and gain better temperature control, device yield and quality will improve.